C. Wachinger, N. Navab
Simultaneous Registration of Multiple Images: Similarity Metrics and Efficient Optimization IEEE Transactions on Pattern Analysis and Maschine Intelligence (TPAMI) (bib) |
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Title: | Article accepted at the IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI) |
Date: | 24 October 2012 |
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Abstract: | Our article on the Simultaneous Registration of Multiple Images has been accepted by the IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI). TPAMI is the one of the two major Computer Vision journals and has currently an impact factor of 5.96 (#1 in electrical engineering and artificial intelligence, within the Top 10 in computer science, overall top-ranked IEEE and Computer Society journal). |
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Type: | Publication |
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