Master's thesis: Detectability Indices for Anisotropic X-ray Dark-field Tomography
Thesis by: Theodor Cheslerean Boghiu
Advisor:
Tobias Lasser
Abstract
Anisotropic X-ray Dark-field Tomography (AXDT) enables the visualization of microstructure orientations without having to explicitly resolve them. Based on the directionally dependent X-ray dark-field signal as measured by an X-ray grating interferometer and our spherical harmonics forward model, AXDT reconstructs spherical scattering functions for every volume position, which in turn allows the extraction of the microstructure orientations. Potential applications range from materials testing to medical diagnostics.
Tasks
Subject of this thesis are detectability indices for use in Anisotropic X-ray Dark-field Tomography (AXDT). The aim is to derive and implement a detectability index for AXDT within our C++ reconstruction framework, in order to use them for optimization of acquisition geometries. The results are to be tested and evaluated on experimental data from our AXDT scanners.
Requirements
Interest in maths, scientific programming, C++
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